@inproceedings{265db30dbdf84ec28f3384f520163923,
title = "D-mapping: A knowledge-based method for requirements mining and concept design",
abstract = "To support automatic requirements mining and concept design for engineering designers, we proposed a knowledge-based method called D-mapping (Design Mapping). In our method, the design problem-solving processes are represented as mappings between functional and physical domains. For requirements mining, the earliest process of concept design, mappings take place inside the functional domain, and thus it is a self-mapping process. For physical architecture design, the later process of concept design, mappings take place between the functional and physical domains, and thus it is a cross-domain mapping process. We built a knowledge-based expert system to assist designers in those processes. The knowledge base of our expert system is based on amounts of Chinese patent texts and built using natural language processing technologies. The knowledge inference engine of our expert system is constructed based on various machine learning algorithms. The proposed method and the system can be proved to be novel and effective in case studies.",
keywords = "concept design, expert system, knowledge engineering, requirements mining",
author = "Mingren Zhu and Lin Gong and Zhenchong Mo and Ziyao Huang",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 17th IEEE Conference on Industrial Electronics and Applications, ICIEA 2022 ; Conference date: 16-12-2022 Through 19-12-2022",
year = "2022",
doi = "10.1109/ICIEA54703.2022.10006000",
language = "English",
series = "ICIEA 2022 - Proceedings of the 17th IEEE Conference on Industrial Electronics and Applications",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "410--416",
editor = "Wenxiang Xie and Shibin Gao and Xiaoqiong He and Xing Zhu and Jingjing Huang and Weirong Chen and Lei Ma and Haiyan Shu and Wenping Cao and Lijun Jiang and Zeliang Shu",
booktitle = "ICIEA 2022 - Proceedings of the 17th IEEE Conference on Industrial Electronics and Applications",
address = "United States",
}