Calibration of misalignment errors in the non-null interferometry based on reverse iteration optimization algorithm

Xinmu Zhang, Qun Hao, Yao Hu*, Shaopu Wang, Yan Ning, Tengfei Li, Shufen Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With no necessity of compensating the whole aberration introduced by the aspheric surfaces, non-null test has the advantage over null test in applicability. However, retrace error, which is brought by the path difference between the rays reflected from the surface under test (SUT) and the incident rays, is introduced into the measurement and makes up of the residual wavefront aberrations (RWAs) along with surface figure error (SFE), misalignment error and other influences. Being difficult to separate from RWAs, the misalignment error may remain after measurement and it is hard to identify whether it is removed or not. It is a primary task to study the removal of misalignment error. A brief demonstration of digital Moiré interferometric technique is presented and a calibration method for misalignment error on the basis of reverse iteration optimization (RIO) algorithm in non-null test method is addressed. The proposed method operates mostly in the virtual system, and requires no accurate adjustment in the real interferometer, which is of significant advantage in reducing the errors brought by repeating complicated manual adjustment, furthermore improving the accuracy of the aspheric surface test. Simulation verification is done in this paper. The calibration accuracy of the position and attitude can achieve at least a magnitude of 10-5 mm and 0.0056×10-6rad, respectively. The simulation demonstrates that the influence of misalignment error can be precisely calculated and removed after calibration.

Original languageEnglish
Title of host publicationAOPC 2017
Subtitle of host publication3D Measurement Technology for Intelligent Manufacturing
EditorsAnand Krishna Asundi, Huijie Zhao, Wolfgang Osten
PublisherSPIE
ISBN (Electronic)9781510613973
DOIs
Publication statusPublished - 2017
EventApplied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017 - Beijing, China
Duration: 4 Jun 20176 Jun 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10458
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceApplied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017
Country/TerritoryChina
CityBeijing
Period4/06/176/06/17

Keywords

  • Aspheric surface measurement
  • Misalignment error calibration
  • Non-null interferometry

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